Stop Hunting, Start Solving: Accelerating Root Cause Analysis with Agentic AI
event.on24.com Spotfire
A webinar promoted a semiconductor analytics platform to speed multi-domain root cause analysis for yield excursions by using agentic AI and push-down compute instead of siloed dashboards. The session includes a live demonstration using Spotfire Industry Pro across “billions of data points.” As a result, engineers are expected to investigate yield/process issues faster while connecting metrology, tool traces, chemical analysis, and facilities systems without moving data.
Why it matters
About this WebinarTurn Yield Excursions into Faster, More Confident Root Cause AnalysisWhen a yield issue emerges, the answer rarely lives in a single system. Critical clues are spread across metrology data, tool traces, chemical analysis, and facilities systems, while growing data volumes make traditional dashboards slow, fragmented, and difficult to act on.What You’ll Learn:Discover how a purpose-built semiconductor analytics platform can help engineers connect insights across domains without moving data. See how Agentic AI, semiconductor-specific visualizations, and push-down compute enable faster investigation of yield excursions and process issues, even across billions of data points. In the session, a live demonstration shows how to conduct a multi-domain root cause investigation using Spotfire® Industry Pro.Key Takeaways:Understand why siloed manufacturing data delays yield recovery and inflates costsLearn how Agentic AI automates complex cross-domain analytics and visualization